GB/T 48164.2-2026 · Semiconductor devices—Reliability test method for silicon carbide metal-oxide semiconductor field effect transistors (SiC MOSFET)—Part 2: Test method for bipolar degradation due to body diode operation · 发布单位:国家市场监督管理总局、国家标准化管理委员会
GB/T 48164.1-2026 · Semiconductor devices—Reliability test method for silicon carbide metal-oxide semiconductor field effect transistors (SiC MOSFET)—Part 1: Test method for bias temperature instability · 发布单位:国家市场监督管理总局、国家标准化管理委员会
GB/T 24986.5-2026 · Testing evaluation methods for reliability on household and similar electrical appliances—Part 5: Particular requirements for room heaters · 发布单位:国家市场监督管理总局、国家标准化管理委员会
GB/T 24986.7-2026 · Testing evaluation methods for reliability on household and similar electrical appliances—Part 7:Particular requirements for electrical toilets · 发布单位:国家市场监督管理总局、国家标准化管理委员会
GB/T 47725-2026 · Micro-electromechanical systems (MEMS) technology—Requirements for reliability evaluation of three-dimensional structure of through-silicon vias · 发布单位:国家市场监督管理总局 国家标准化管理委员会